The equipment for microstructure investigation
IPAM has in its disposal TEM JEM 100B (fig. 1) and Tonupol tool for preparation of high quality TEM foils.

Figure 1. A transmission electron microscope JEM 100B

X-ray measurements are performed using x-ray diffractometers DRON 4.07 (fig. 2), which allows to obtain 2θ diffraction patterns for size-strain separation and phase analysis and DRON 3M, equipped with an automated texture add-on unit to conduct texture studies.

Figure 2. DRON 4.07 x-ray diffractometer

There is also an equipment for optical metallography investigations: computer-managed structure analyzer Epiquant and optical microscopes (fig. 3).

Figure 3. Optical metallography study