IPAM has in its disposal TEM JEM 100B (fig. 1) and Tonupol tool
for preparation of high quality TEM foils.|
Figure 1. A transmission electron microscope JEM 100B
X-ray measurements are performed using x-ray diffractometers DRON 4.07 (fig. 2),
which allows to obtain 2θ diffraction patterns for size-strain
separation and phase analysis and DRON 3M, equipped with an automated texture
add-on unit to conduct texture studies.
Figure 2. DRON 4.07 x-ray diffractometer
There is also an equipment for optical metallography investigations:
computer-managed structure analyzer Epiquant and optical microscopes (fig. 3).
Figure 3. Optical metallography study